Two CNC milling operations: planning the locating surfaces

The workshop photographs record two milling operations on the same component. For a new part that needs repositioning, the locating scheme must preserve the relationships between features made in each operation.

D-shaped part lying flat in soft jaws with its top recess facing the milling spindle

Plan the initial operation

For a new part, we start with the dimensions linking opposite or adjacent faces. Those relationships, stock dimensions and support needs determine the first operation.

Locate the next operation

The drawing identifies functional datums, critical relationships and surfaces that cannot be clamped. With stock dimensions and known clamping restrictions, we can review locating surfaces, tool reach and jaw contact for each setup.

D-shaped part standing upright in soft jaws to expose a perpendicular edge

Check relationships after both setups

After both setups, we check the dimensions connecting them. The inspection plan identifies which features to measure together, critical measurement points, sampling and report format.

CMM probe approaching the deep pocket of the same D-shaped aluminum component shown in the milling setups
Acceptance stageDrawing and inspection requirements
First setup

Define locating faces and initial datum features, with the first-stage dimensions to record.

Second setup

Define datum transfer and dimensions linking both faces. Agree relative-position checks after repositioning.

Finished component

Specify material, finish and critical dimensions, with agreed measurement points, sampling and report format.

The inspection plan connects each requirement to a measurement method, final surface condition and support arrangement, with sampling and report format set before production.

Discuss a similar component

  • Model, drawing and approved revision
  • Stock dimensions and any clamping restrictions
  • Functional datums and critical relationships between faces
  • Material, finish, quantity and protected surfaces
  • Required measurement points, sampling and reports
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